Located in their new North American Tech Center, LK Metrology offers a new CMM measurement services department for performing contract dimensional inspection.
Engineering information is both pervasive and essential within manufacturing plants. And, it changes constantly as a result of maintenance-related adjustments, alterations in plant processes, or the swap-out of components.
Marposs said its new Mida Hyper Probing software can achieve an 80% reduction in cycle time, ensuring fast and precise probing.
Boeing Co., which had wanted to return the 737 Max to service this month, threw up the surrender flag on Dec. 16. The company said it will suspend 737 Max production in January.
In my capacity as the Chair of the Council of the Manufacturing USA institute directors, I often get asked about trends in U.S. advanced manufacturing.
Metrology-grade laser scanners are expanding their range of applications. New users are finding the main attractions of laser scanners—speed and ease of use. What prevented more widespread use in the past were laser scanners’ perceived tradeoffs. Using one usually meant sacrificing accuracy or working with noisy data.
The Measuring Division of Kaman Precision Products, Inc. announces the availability of its line of Extreme Environment high-precision displacement sensors and systems.
Simcenter Testlab enables better usage of test-based data, from design and simulation to validation and certification.
Technology is changing ever more rapidly. Sometimes this means topics learned in engineering or technical school become obsolete. Whole new fields emerge within a few years, so that even those with freshly minted educations suddenly find themselves faced with new challenges.
Basic trends in modern manufacturing are driving growth in 3D optical metrology. “One is the highly complex and high-tech material that manufacturers are using today. For example, in the aerospace turbine blade market, they simply cannot touch the part like they used to—the surface finish of the material is too readily affected by any kind of contact metrology."
